Lead Expert

Lead Expert - Etch, Deposition, ALD & Metallization Metrology Nearfield Instruments Rotterdam, Netherlands Posted on Jul 16, 2026 Job description About Nearfield Instruments Nearfield Instruments (NFI) is a fast-growing, high-tech scale-up. We design, develop, integrate, market, and service advanced metrology machines. Our solutions enable the world's leading chipmakers to increase production yield and improve device performance-powering smaller, faster, and more energy-efficient electronics. Nearfield brings together leading experts in science and engineering to develop a unique, high-throughput Scanning Probe Microscopy (SPM) platform delivering true 3D, sub-nanometer resolution metrology at production scale. We are looking for a senior semiconductor expert with deep experience in etching, thin-film deposition, atomic layer deposition (ALD), and metallization , gained within a leading-edge fab, research institute, or semiconductor equipment company. This expert will lead Nearfield Instruments' application and technology direction for advanced patterning, thin-film formation, conformal deposition, and metal integration. The role will identify the most critical process-control challenges, translate them into clear metrology requirements, and drive the development of new applications, capabilities, and product features that create greater value for customers. Key responsibilities include: - Lead the identification of unmet metrology needs and critical process-control gaps in etch, deposition, ALD, and metallization. - Define the most valuable measurements, specifications, and use cases, including trench and via depth, sidewall profile, recess, footing, bowing, surface roughness, film conformality, step coverage, thickness uniformity, interface topography, and metal dishing or overburden. - Set application priorities and translate customer and manufacturing needs into product and technology roadmaps. - Lead engagement wi...

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